Semiconductor/FPD Inspection Microscope MX63/MX63L
Making inspections of semiconductors and FPDs more comfortable and efficient.
The MX63/MX63L is a large microscope capable of inspecting samples such as wafers and LCD panels up to 300mm in size, as well as electronic substrates. By combining various modules that cater to different applications, we can provide a beneficial system for our customers. Furthermore, when combined with the PRECiV image analysis software, we offer a seamless workflow from observation to report generation.
- Company：ナガタ
- Price：Other
